M59DR016C |
RFQ for M59DR016C |
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| Product | Manufacturers | Pack | D/C |
| M59DR016C | - | - | - |
The M59DR016 is a 16 Mbit non-volatile Flash memory that may be erased electrically at block level and programmed in-system on a Word-by-Word basis using a 1.65V to 2.2V VDD supply for the circuitry. For Program and Erase operations the necessary high voltages are generated internally.The device supports asynchronous page mode from all the blocks of the memory array.
The array matrix organization allows each block to be erased and reprogrammed without affecting other blocks. All blocks are protected against programming and erase at Power Up. Blocks can be unprotected to make changes in the application and then reprotected.
Instructions for Read/Reset, Auto Select, Write Configuration Register, Programming, Block Erase, Bank Erase, Erase Suspend, Erase Resume,Block Protect, Block Unprotect, Block Locking,CFI Query, are written to the memory through
a Command Interface using standard microprocessor write timings.
The device is offered in TFBGA48 (0.75 mm pitch) packages and it is supplied with all the bits erased (set to '1').
Features |
| ` SUPPLY VOLTAGE VDD = VDDQ = 1.65V to 2.2V for Program,Erase and Read VPP = 12V for fast Program (optional)` ASYNCHRONOUS PAGE MODE READ Page Width: 4 words Page Access: 35ns Random Access: 100ns` PROGRAMMING TIME 10s by Word typical Double Word Programming Option`MEMORY BLOCKS Dual Bank Memory Array: 4 Mbit - 12 Mbit Parameter Blocks (Top or Bottom location)` DUAL BANK OPERATIONS Read within one Bank while Program or Erase within the other No delay between Read and Write operations` BLOCK PROTECTION/UNPROTECTION All Blocks protected at Power Up Any combination of Blocks can be protected` COMMON FLASH INTERFACE (CFI)` 64 bit SECURITY CODE`ERASE SUSPEND and RESUME MODES` 100,000 PROGRAM/ERASE CYCLES per BLOCK` ELECTRONIC SIGNATURE Manufacturer Code: 20h Top Device Code, M59DR016C: 2293h Bottom Device Code, M59DR016D: 2294h |
|
Symbol |
Parameter |
Value |
Unit |
|
TA |
Ambient Operating Temperature (2) |
-40to85 |
°C |
|
TBIAS |
Temperature Under Bias |
-40to125 |
°C |
|
TSTG |
Storage Temperature |
-55to155 |
°C |
|
VIO |
Input or Output Voltage |
-0.5toVDDQ+0.5
|
V
|
|
VDD,VDDQ |
Supply Voltage |
-0.5to2.7 |
V |
|
VPP |
Program Voltage |
-0.5to13 |
V |
Note: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Op